There are always two sides to every object and the method of schlieren apparatus can measure methods of the two sides at a time.Measurement of objects outside description normally adopted in battle with the two kinds of war, war in the measurement of partial twists with light interference and glow in the most typical.Intervention measurement of optical path difference, interference with each point of light intensity on the drawing and the optical path difference is more than a pair of involvement, means less than complete must be measured based on a drawing of the intervention, outside is always introduce phase shift technique in the intervention, intervention with more than one figure to calculate the phase of each point and the ultimate reconstruction outside surface to be tested.Graded description outside measurement is an important measurement of the subject, some crystal in its development process often need to research and examine its concentration changes and describe the microscopic changes outside.Based on phase shift interference method is not suitable for measurement changes outside of the description.Schlieren instrument method and moire measurement method for measurement of light deflection Angle, it not only includes the point slope intrusive information, and also including the slope tag information, is suitable for the measurement of static description outside, need to get both towards the outside of the gradient change information.And as I mentioned earlier, so whether schlieren method Mohr partial measurement method by all means less at the same time for two bias of gradient information.Now just like you said so much!If you want to understand, then to our company to get to know!Contact phone: 0816-6204826
